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Highlights

Versatile yet Easy to use Board Test Tool

The x1149 is a tool for engineers to perform structural tests, such as open and short tests, on their PCBAs. It also performs In-System Programming for devices such as Field-Programmable Gate Arrays (FPGAs) and Complex-Programmable Logic Devices (CPLDs).

Additionally, x1149 programs PROM (Programmable Read-Only Memory) devices and executes memory verification tests on devices such as DDR SDRAM (Double Data Rate Synchronous Dynamic Random-Access Memory). This allows you to program and reprogram these devices, providing greater flexibility and control during development. With its advanced testing capabilities and user-friendly software, the Keysight x1149 is the ideal solution for all your circuit board testing needs.

x1149 2.1 Features

  • IEEE Standards
    • 1149.1-2013 (New)
    • 1149.6-2015 (New)
    • 1149.1-2001
    • 1149.6-2003
    • 1687-2014
  • Custom test with Insert Source Language (ISL) 2.0
  • Support Autobank and Scan Path Linker
  • New BSDL extension for 1149.1 and 1149.6-2015 standard
  • Greater flexibility and support for IP packages and programmable features in both the 1149.1 and 1149.6 standard

Test Development

  • Maximize test coverage on connectors and non-boundary scan ICs
  • Excellent debug tools
  • Actionable pin-level failure reporting
  • In-system Programming

Applications

  • Excellent Test Coverage for Netcom, Server Products, and Automotive customers
  • IEEE 1687 Solution for Board Test and Embedded Instrumentation testing
  • Automated Configuration of Scan Path Linkers
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What's New in Keysight x1149 Boundary Scan Analyzer

IEEE 1149.1-2013 Standard

With the new standard of IEEE 1149.1-2013, you can expect around a 75% increase in test coverage with the following test capabilities:

  • Register mnemonic
  • IC reset control
  • Component initialization mechanism
  • Segmented boundary scan register
  • Power domain support
  • Test mode persistence
  • Electronic Chip Identification (ECID)
  • Procedural Description Language (PDL)
Keysight x1149 2.0

IEEE 1149.6-2015 Standard

IEEE 1149.6-2015 represents the most up-to-date version of the 1149.6 standard. This version of 1149.6 focuses on enhanced AC-coupled capacitor detection and differential interconnections on very high-speed (1+Gb/s) digital data paths. The test types included in this standard are the interconnect dot 6, bus wire dot 6, and shorted cap dot 6.

The value of having IEEE 1149.1-2013 and 1149.6-2015 is to enable:

  • Cost-saving in testing for boards and systems.
  • Preparation, execution, and interpretation of tests in a highly automated fashion and with high diagnostic resolution.
  • Facilitation of the operation of multiple vendors' devices together during testing, despite variations in characteristics and parameters used by the devices.

Efficient Testing Solutions for High-Speed Connections

Testing high-speed interfaces on printed circuit board assemblies (PCBAs), such as DDR4, DDR5, and PCIe x 16 connectors, presents significant challenges. Utilizing actual RAM or PCIe cards may not be feasible due to cost concerns in high-volume production testing. Our solution involves a specialized dummy card that complements the boundary scan testing process. By integrating this dummy card into your testing routine, you can accurately simulate these critical components, enabling precise diagnostics while mitigating risks associated with using actual hardware.

Keysight x1149 2.0

News & Events

Vision Award 2022

SbS Excellence Gold Award

We are thrilled to announce that Keysight's x1149 2.0 Boundary Scan Analyzer has received the prestigious SbS Excellence Gold Award (formerly Vision Award) in the 'Testing System-ATE' category at Nepcon Asia 2023 in Shenzhen as part of the 17th Step-by-Step Excellence Awards (formerly known as SMT China) for Innovative Products & Services in Electronics Manufacturing.

Industry Insights and Networking

Each year, Keysight hosts a user group meeting (UGM) tailored for professionals in the manufacturing test industry. This event offers a unique opportunity for our customers to gain insights from industry experts on the latest challenges and solutions in manufacturing testing.

Join us at an event near you to expand your knowledge, enhance your expertise, and connect with top professionals in the field.

Learn more

Extend the Capabilities for Your x1149 Boundary Scan Analyzer

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